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Grating Spectrophotometer YR05494

$2,600.00
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Grating Spectrophotometer YR05495

$1,933.00

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Description

Description
The Grating Spectrophotometer YR05495 by Kalstein is engineered to deliver exceptional color analysis precision across diverse industrial sectors, including electronics, cosmetics, textiles, plastics, automotive, and food production. This sophisticated tool boasts three measurement apertures (φ8 mm, φ4 mm, 1×3 mm) and is equipped with advanced 1000-line precision grating technology. Utilizing a silicon photodiode array sensor and a full-spectrum LED light source, it guarantees reliable color assessment in the visible range (400-700 nm). For laboratories and production management seeking flexible SCI and SCE measurements, its dual optical structure makes the YR05495 an exceptional choice for quality control.

Features
Three measurement apertures for diverse sample sizes
Advanced grating technology and silicon photodiode array sensor
Dual optical structure for SCI and SCE measurements
Compatibility with PC software for data management
High storage capacity for standards and samples

Technical Specifications
Models YR05495
Optical Geometry Reflect: di:8°, de:8°(diffuse illumination, 8-degree viewing angle)
SCI (mirror component included)/SCE; UV light source excluded
Complies with CIE No.15, GB/T 3978, GB 2893, GB/T 18833, ISO7724-1, ASTM E1164, DIN5033 Teil7
Characteristic Custom aperture for accurate color measurement and quality control in plastics, electronics, paint, ink, textiles, garment printing and dyeing, printing, ceramics, and measuring fluorescent samples.
Integrating Sphere Size Φ40mm
Light Source Combined full spectrum LED light source, UV light source
Spectrophotometric Mode Flat grid
Sensor Silicon photodiode array (dual row 40 groups)
Wave Range 400~700nm
Wavelength Range 10nm
Semi-bandwidth 10nm
Medium Reflectance Range 0-200%
Measurement Aperture A customized aperture: MAV:Φ8mm/Φ10mm; SAV:Φ4mm/Φ5mm
Specular Component SCI & SCE
Color Space CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, βxy, Munsell (C/2)
Color Difference Formula ΔE*ab, ΔE*uv, ΔE*94, ΔE*cmc(2:1), ΔE*cmc(1:1), ΔE*00
Other Color Index WI (ASTM E313, CIE/ISO, AATCC, Hunter),
YI (ASTM D1925, ASTM 313),
Stain fastness, color fastness, color intensity, opacity,
8th Brightness,
Observer Angle 2°/10°
Illuminator D65, A, C, D50, F2(CWF), F7(DLF), F10(TPL5), F11(TL84), F12(TL83/U30)
Data Displayed Spectrogram/Values, Sample Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Compensation
Measuring Time About 1.5s (measure SCI and SCE about 3.2s)
Repeatability Spectral Reflectance: MAV/SCI, Standard Deviation within 0.1% (400nm to 700nm: within 0.2%)
Chromaticity Value: MAV/SCI, within ΔE*ab 0.04 (when a white calibration plate is measured 30 times at 5-second intervals after white calibration)
Error Between Instruments AVM/SCI, Within ΔE*ab 0.2
(Average for 12 BCRA Series II color tiles)
Measurement Mode Single measurement, average measurement (2-99 times)
Location Method Camera location, stabilizer cross position
Dimension L*W*H=129X76X217mm
Weight About 600g
Power Li-ion battery, 3.7 V, 5,000 mAh, 6,000 measurements in 8 hours
Illuminant Lifespan 5 years, more than 3 million times detected
Data Displayed 3.5-inch TFT color LCD, capacitive touch screen
Data Port USB,
Data Storage 1,000 standard pieces, 20,000 sample pieces
Language Simplified Chinese, English, Traditional Chinese
Operating Environment 0~40℃, 0~85%RH (no condensation), Altitude < 2000m
Storage Environment -20~50℃, 0~85%RH (no condensation)
Standard Accessory Power adapter, user guide, PC software (download from office website), USB cable, black and white calibration well, protective cover, wrist strap, one aperture (8mm or 4mm)
Optional Accessory Micro printer, dustproof box
Notes Specifications are subject to change without notice.

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