Description
Enhance AFM with Chemical Identification
SignatureSPM is the first microscope built on a multimodal characterization platform, integrating an automated Atomic Force Microscope (AFM) with a Raman/Photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties.
Through the combined physical and chemical knowledge obtained in a single, and real-time measurement, the researcher can obtain a reliable and comprehensive analysis of the sample, with a shortened time to knowledge as a result of lesser sample handling and a data acquisition of with a high confidence level, thanks to the correlation of difference measurements.




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